Force Modulation Microscopy

In FMM the probe tip tracks the sample topography as in normal. In addition, a periodic signal (driving signal) mechanically drives the cantilever in the Z-direction. The amplitude of cantilever modulation that results from this applied signal varies according to the elastic properties of the sample.

Force Modulation Microscopy Atomic Force Microscopy

Force Modulation Microscopy Atomic Force Microscopy

Force Modulation Microscopy Atomic Force Microscopy