ATOMIC FORCE MICROSCOPY (AFM)

ATOMIC FORCE MICROSCOPY (AFM)

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Atomic Force Microscopy catalog

Product brief:

The main product of Ara Research is Atomic Force Microscopy (AFM). AFM as an important apparatus in the applied nano projects and industries related to nano technology, is now produced with the latest known AFM-modes and most developed hardware and software.

AFM(Atomic force microscope)

Design Objectives

• Different Data Channels Including Amplitude, Phase, Topography
• High Sampling Rate and Digital Filtering Implementation
• High Bandwidth Sensors and High Quality Nano Scanner
• Disturbance and Noise Rejection through Closed Loop Operation

afm(Atomic force microscope)

Nano-ara software ver 1.01 includes:

• Surface slope compensation
• Ability of accepting Hysteresis and nonlinearity Enhancement correcting factors
• User interface environment
• Control parameters Adjustment

Some of the adjustable parameters are as below:

  • Scanning speed & range
  • Angle of scanning
  • Reference force
  • Proportional & Integration coefficients of
  • PID control
  • Amplitude & frequency of dithering in dynamic mode
  • Scanning selected zoomed area on previously obtained images
  • Determining the slope coefficients for compensation
  • And many other parameters……………….
The main specifications of ARA-AFM are as follows :
  • Range of scanning: 50 μm
  • Lateral resolution: 1 nm
  • Vertical resolution: 0.1 nm
  • Large scale sample movement: 7mm
  • Laser power: 0.01w
  • Photodiode sensitivity: 18A/W
  • Micro actuator resolution: 0.6 μm
Special Offers
  • 2 year Guaranty and 15 year After Sale Technical Supports
  • Experimental Setup and System Specialization
  • SPM Training Courses and Workshops
  • Providing customers with software updates.